Our litigation experience has shown that problems regarding contributory infringement very often arise in patents involving measuring technology. In order to avoid such problems, a particular challenge is to draft independent claims which are not only directed to the overall measuring system, but also to the important sub-elements of such a system. Moreover, the field of measuring technology requires a particular knowledge of the case law regarding the overlapping aspects of apparatus claims and method claims.

Our attorneys in this field overcome these challenges in their daily practice. Since various technologies are often combined in measuring systems, such as physics, mechanical engineering, optical engineering, electronics and computer technology, we regularly form teams of attorneys who specialize in these fields.

As an example, our attorneys have handled complex infringement and nullity cases in the field of magnetic resonance imaging and computer tomography.